A new method for analytically obtaining the form of an interferogram is proposed. The method permits simple implementation for a computerized treatment. We can use it to determine easily the thickness of a thin film.
© 1993 Optical Society of America
Original Manuscript: June 22, 1992
Published: May 1, 1993
A. González-Cano and E. Bernabéu, "Automatic interference method for measuring transparent film thickness," Appl. Opt. 32, 2292-2294 (1993)