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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 32, Iss. 13 — May. 1, 1993
  • pp: 2411–2421

Photographic response to x-ray irradiation. III: Photographic linearization of beam-foil spectra

C. T. Chantler, J. D. Silver, and D. D. Dietrich  »View Author Affiliations


Applied Optics, Vol. 32, Issue 13, pp. 2411-2421 (1993)
http://dx.doi.org/10.1364/AO.32.002411


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Abstract

In this paper models for the relation of specular density to incident (x-ray) intensity with uncertainties are applied to experimental data, indicating methods for the correction of additional effects. Linearization and error calculations are simplified by double linear interpolation, and the effect of this is quantified. Relative first-order intensities are determined directly. Secondary linearization or calculation for higher-order lines gives correction factors that yield absolute and relative higher-order intensity ratios. The effects of energy and angle on linearization are included. Densitometry uncertainty is estimated and quantified.

© 1993 Optical Society of America

Citation
C. T. Chantler, J. D. Silver, and D. D. Dietrich, "Photographic response to x-ray irradiation. III: Photographic linearization of beam-foil spectra," Appl. Opt. 32, 2411-2421 (1993)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-32-13-2411

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