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Applied Optics

Applied Optics


  • Vol. 32, Iss. 21 — Jul. 20, 1993
  • pp: 4003–4018

Analysis of laser light-scattering interferometric devices for in-line diagnostics of moving particles

Amir A. Naqwi and Franz Durst  »View Author Affiliations

Applied Optics, Vol. 32, Issue 21, pp. 4003-4018 (1993)

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Dual-beam laser measuring techniques are now being used, not only for velocimetry, but also for simultaneous measurements of particle size and velocity in particulate two-phase flows. However, certain details of these optical techniques, such as the effect of Gaussian beam profiles on the accuracy of the measurements, need to be further explored. To implement innovative improvements, a general analytic framework is needed in which performances of various dual-beam instruments could be quantitatively studied and compared. For this purpose, the analysis of light scattering in a generalized dual-wave system is presented in this paper. The present simulation model provides a basis for studying effects of nonplanar beam structures of incident waves, taking into account arbitrary modes of polarization. A polarizer is included in the receiving optics as well. The peculiar aspects of numerical integration of scattered light over circular, rectangular, and truncated circular apertures are also considered.

© 1993 Optical Society of America

Original Manuscript: August 13, 1991
Published: July 20, 1993

Amir A. Naqwi and Franz Durst, "Analysis of laser light-scattering interferometric devices for in-line diagnostics of moving particles," Appl. Opt. 32, 4003-4018 (1993)

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