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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 32, Iss. 25 — Sep. 1, 1993
  • pp: 4744–4750

Interference microscopy and Fourier fringe analysis applied to measuring the spatial refractive-index distribution

S. Kostianovski, S. G. Lipson, and E. N. Ribak  »View Author Affiliations


Applied Optics, Vol. 32, Issue 25, pp. 4744-4750 (1993)
http://dx.doi.org/10.1364/AO.32.004744


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Abstract

We have applied the technique of Fourier fringe analysis to microscopic interferograms of needle crystals that grow from a solution. We use a differential technique in which an empty field interferogram is compared with one that contains distortion and obscuration by the growing crystal, and we demonstrate both analytically and experimentally a phase shift sensitivity of 0.01 fringe with a spatial resolution of half of a fringe spacing (~1 μm). Following the analysis of the interferogram in two dimensions, we show that the three-dimensional refractive-index field around the crystal can be deduced, assuming that it is axially symmetric, by an iterative method.

© 1993 Optical Society of America

History
Original Manuscript: August 5, 1992
Published: September 1, 1993

Citation
S. Kostianovski, S. G. Lipson, and E. N. Ribak, "Interference microscopy and Fourier fringe analysis applied to measuring the spatial refractive-index distribution," Appl. Opt. 32, 4744-4750 (1993)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-32-25-4744

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