Abstract

A modification of the multipass Twyman–Green interferometer is suggested that avoids the walk-off problem. Also, a data reduction scheme has been developed that permits most of the aberrations of the ancillary optics to be separated from those of the test piece.

© 1993 Optical Society of America

Holographic Twyman-Green interferometer

Chungte W. Chen and James B. Breckinridge
Appl. Opt. 21(14) 2563-2568 (1982)

Multipass Twyman-Green Interferometer

P. Langenbeck
Appl. Opt. 6(8) 1425-1426 (1967)

Combined Twyman–Green and Mach–Zehnder interferometer for microlens testing

Stephan Reichelt and Hans Zappe
Appl. Opt. 44(27) 5786-5792 (2005)

Measurement of displacement and distance with a polarization phase shifting folded Twyman Green interferometer

Sanjib Chatterjee and Y. Pavan Kumar
Appl. Opt. 54(33) 9839-9843 (2015)

Determination of the tangential surface profile of Toroidal beam line mirrors with polarization phase-shifting Twyman–Green interferometer

Sanjib Chatterjee and Y. Pavan Kumar
Appl. Opt. 54(3) 444-450 (2015)