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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 32, Iss. 25 — Sep. 1, 1993
  • pp: 4864–4868

Control of the tip–surface distance in near-field optical microscopy

S. I. Bozhevolnyi, O. Keller, and M. Xiao  »View Author Affiliations


Applied Optics, Vol. 32, Issue 25, pp. 4864-4868 (1993)
http://dx.doi.org/10.1364/AO.32.004864


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Abstract

An experimental technique that makes use of the intensity of the interference pattern formed by light that propagates directly from the single-mode fiber tip and light that is reflected by the surface under an oblique angle of incidence is developed to control the tip–surface distance in near-field optical microscopy. It is shown that by using another fiber as a detector with a polished edge placed at the surface near the fiber tip one can determine the tip–surface separation with an accuracy better than 15 nm at distances less than 1 μm. The technique proposed is used to investigate the influence of the shape of the tip in near-field measurements.

© 1993 Optical Society of America

History
Original Manuscript: June 16, 1992
Published: September 1, 1993

Citation
S. I. Bozhevolnyi, O. Keller, and M. Xiao, "Control of the tip–surface distance in near-field optical microscopy," Appl. Opt. 32, 4864-4868 (1993)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-32-25-4864

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