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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 32, Iss. 26 — Sep. 10, 1993
  • pp: 4960–4971

Low-frequency electromagnetic (eddy-current) holography for imaging in conductors

J. M. Prince and B. P. Hildebrand  »View Author Affiliations


Applied Optics, Vol. 32, Issue 26, pp. 4960-4971 (1993)
http://dx.doi.org/10.1364/AO.32.004960


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Abstract

Typical eddy-current system test data consist of the values of the system’s probe impedance. The wave theory that links the phase response of the eddy-current probe impedance to the defect location relative to the probe is presented. The technique of phase multiplying the diffraction-limited hologram generated from the probe impedance is discussed. The effects and limitations of this technique are illustrated with a mathematical model of the eddy-current probe. Experimental data are presented that confirm the theoretical analysis and illustrate the ability to focus eddy-current holographic data by using backward wave propagation.

© 1993 Optical Society of America

History
Original Manuscript: November 5, 1992
Published: September 10, 1993

Citation
J. M. Prince and B. P. Hildebrand, "Low-frequency electromagnetic (eddy-current) holography for imaging in conductors," Appl. Opt. 32, 4960-4971 (1993)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-32-26-4960


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References

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