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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 32, Iss. 28 — Oct. 1, 1993
  • pp: 5492–5503

Comparison of surface and bulk scattering in optical multilayers

Claude Amra, C. Grèzes-Besset, and L. Bruel  »View Author Affiliations


Applied Optics, Vol. 32, Issue 28, pp. 5492-5503 (1993)
http://dx.doi.org/10.1364/AO.32.005492


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Abstract

Electromagnetic theories provide a tool to detect the origin of scattering in optical multilayers. Illumination and observation conditions that cause surface and bulk scatterings to have different behaviors are pointed out. Angular, wavelength, and polarization dependences are investigated for the location of structural irregularities at interfaces or in the bulk of a multilayer. Specific experiments can be designed.

© 1993 Optical Society of America

History
Original Manuscript: November 16, 1992
Published: October 1, 1993

Citation
Claude Amra, C. Grèzes-Besset, and L. Bruel, "Comparison of surface and bulk scattering in optical multilayers," Appl. Opt. 32, 5492-5503 (1993)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-32-28-5492


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References

  1. C. Amra, P. Roche, E. Pelletier, “Interface roughness cross-correlation laws deduced from scattering diagram measurements on optical multilayers: effect of the material grain size,” J. Opt. Soc. Am. B. 4, 1087–1093 (1987). [CrossRef]
  2. C. Amra, J. H. Apfel, E. Pelletier, “Role of interface correlation in light scattering by a multilayer,” Appl. Opt. 31, 3134–3151 (1992). [CrossRef] [PubMed]
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  6. This paper was originally presented at the joint session on scattering of the First Topical Meeting on Surface Roughness and Scattering and the Fifth Topical Meeting on Optical Interference Coatings that was held in Tucson, Ariz., June 1992.
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  9. C. Amra, P. Bousquet, “Scattering from surfaces and multilayer coatings: recent advances for a better investigation of experiment,” in Surface Measurement and Characterization, J. M. Bennett, ed., Proc. Soc. Photo-Opt. Instrum. Eng.1009, 82–97 (1988).
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  13. C. Amra, “First-order vector theory of bulk scattering in optical multilayers,” J. Opt. Soc. Am. A 10, 365–374 (1993). [CrossRef]
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  17. H. A. Macleod, Thin-Film Optical Filters (Hilger, London, 1986). [CrossRef]
  18. A. G. Dirks, H. J. Leamy, “Columnar microstructure in vapor-deposited thin films,” Thin Solid Films 47, 219–223 (1977). [CrossRef]
  19. A. A. Maradudin, D. L. Mills, “Scattering and absorption of electromagnetic radiation by a semi-infinite medium in the presence of surface roughness,” Phys. Rev. B 11, 1392–1415 (1975). [CrossRef]
  20. Results from surface scattering were compared by these authors and show high agreement for multilayers at oblique incidence.
  21. P. Croce, L. Prod'homme, “Etude par diffusion lumineuse de la nature des surfaces de verre poli,” J. Opt. (Paris) 7, 121–132 (1976).
  22. J. M. Eastman, “Surface scattering in optical interference coatings,” Ph.D. dissertation (University of Rochester, Rochester, New York, 1974).
  23. H. E. Bennett, J. O. Porteus, “Relation between surface roughness and specular reflectance at normal incidence,” J. Opt. Soc. Am. 51, 123–129 (1961). [CrossRef]
  24. C. Amra, “Minimizing scattering in multilayers: technique for searching optimal realization conditions,” in Laser Induced Damage in Optical Materials, 756, 265–271 (1987).
  25. C. Amra, G. Albrand, P. Roche, “Theory and application of antiscattering single layers: antiscattering antireflection coatings,” Appl. Opt. 25, 2695–2702 (1986). [CrossRef] [PubMed]
  26. C. Amra, “Scattering distribution from multilayer mirrors— Theoretical research of a design for minimal losses,” in Laser Induced Damage in Optical Materials, 752, 594–602 (1986).

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