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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 32, Iss. 31 — Nov. 1, 1993
  • pp: 6256–6263

Automated spatially scanning ellipsometer for retardation measurements of transparent materials

J. E. Hayden and S. D. Jacobs  »View Author Affiliations


Applied Optics, Vol. 32, Issue 31, pp. 6256-6263 (1993)
http://dx.doi.org/10.1364/AO.32.006256


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Abstract

A highly sensitive and automated technique has been developed for measuring the birefringence in transparent optical materials. The spatially scanning modulated transmission ellipsometer maps the birefringence of a transparent material by probing it with a polarization-modulated He–Ne laser beam. Computer-controlled voltage biasing of a Pockels cell permits self-calibration and background subtraction of the system retardance. The technique is capable of resolving differential retardances as small as 0.1 nm (λ/6328) through a range of ±λ/2, where λ = 632.8 nm. Samples typically range in size from 50 μm to 10 cm in diameter within the sample plane and as much as 400 mm along the optical axis.

© 1993 Optical Society of America

History
Original Manuscript: April 17, 1992
Published: November 1, 1993

Citation
J. E. Hayden and S. D. Jacobs, "Automated spatially scanning ellipsometer for retardation measurements of transparent materials," Appl. Opt. 32, 6256-6263 (1993)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-32-31-6256


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