Arbitrary-intensity-profiles measurement of laser beams by a scanning and rotating slit
Applied Optics, Vol. 32, Issue 35, pp. 7272-7276 (1993)
http://dx.doi.org/10.1364/AO.32.007272
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Abstract
By taking advantage of the mathematical analogy of optical power passing through a narrow slit and the attenuation of an x-ray beam passing through a biological tissue, and by applying to the optical case the projection and reconstruction algorithms of computed tomography, one can determine in detail the intensity profile of an arbitrary laser beam by properly combining the position and orientation of the slit. Until now, to the best of my knowledge, the scanning slit has been limited to the measurement of Gaussian or nearly Gaussian beams.
© 1993 Optical Society of America
Citation
Jose Soto, "Arbitrary-intensity-profiles measurement of laser beams by a scanning and rotating slit," Appl. Opt. 32, 7272-7276 (1993)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-32-35-7272
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