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Applied Optics

Applied Optics


  • Vol. 33, Iss. 13 — May. 1, 1994
  • pp: 2659–2663

Envelope and waveguide methods: a comparative study of PbF2 and CeO2 birefringent films

F. Horowitz and S. B. Mendes  »View Author Affiliations

Applied Optics, Vol. 33, Issue 13, pp. 2659-2663 (1994)

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We have characterized low-birefringence, PbF2 coatings to permit, first, agreement between envelope and prism-coupler waveguide methods under the standard isotropic assumption. In essentially the same measurement conditions, for obliquely deposited (58.3°) CeO2 coatings the isotropic model becomes unsustainable. Explicit consideration of the film microstructure is then required for good correlation between thickness results from TE (503 ± 9 nm) and TM (504 ± 10 nm) modes in the waveguide experiment as well as between refractive-index results from envelope (n2 = 1.78 ± 0.03) and waveguide (n2 = 1.794 ± 0.002) techniques. We considered uniaxial and biaxial models to achieve consistency, and the refractive indices along the principal axes of symmetry were determined.

© 1994 Optical Society of America

Original Manuscript: July 7, 1992
Revised Manuscript: August 23, 1993
Published: May 1, 1994

F. Horowitz and S. B. Mendes, "Envelope and waveguide methods: a comparative study of PbF2 and CeO2 birefringent films," Appl. Opt. 33, 2659-2663 (1994)

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