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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 33, Iss. 16 — Jun. 1, 1994
  • pp: 3342–3347

Refractive-index profiling of planar gradient-index waveguides by phase-measuring microinterferometry

Matgorzata Sochacka, Elena Lopez Lago, and Zbigniew Jaroszewicz  »View Author Affiliations


Applied Optics, Vol. 33, Issue 16, pp. 3342-3347 (1994)
http://dx.doi.org/10.1364/AO.33.003342


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Abstract

A novel measurement technique based on phase-stepping microinterferometry is proposed for the refractive-index profiling of planar waveguides fabricated by ion exchange in glass. The sample preparation simplicity and easy instrumental implementation, together with high accuracy and improved resolution, are argued.

© 1994 Optical Society of America

History
Original Manuscript: July 27, 1993
Revised Manuscript: December 2, 1993
Published: June 1, 1994

Citation
Matgorzata Sochacka, Elena Lopez Lago, and Zbigniew Jaroszewicz, "Refractive-index profiling of planar gradient-index waveguides by phase-measuring microinterferometry," Appl. Opt. 33, 3342-3347 (1994)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-33-16-3342


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References

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