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Optical vector network analyzer as a reflectometer

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Abstract

An optical vector network analyzer similar to that of the microwave network analyzer has been shown to be feasible for the evaluation of optical components. It is shown that this instrument can also be used as a reflectometer. Heterodyne mixing and small linewidth lasers with a large tunable range make it a flexible tool for optical device evaluation and design. Experimental results are presented.

© 1994 Optical Society of America

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