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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 33, Iss. 18 — Jun. 20, 1994
  • pp: 4058–4068

Diffraction and scattering at antiglare structures for display devices

A. M. Nuijs and J. J. L. Horikx  »View Author Affiliations


Applied Optics, Vol. 33, Issue 18, pp. 4058-4068 (1994)
http://dx.doi.org/10.1364/AO.33.004058


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Abstract

Antiglare layers for display devices feature a rough surface structure that scatters the incident light and thereby reduces the specular reflectivity of the screen. The same structure will, however, also diffuse part of the light from the phosphor layer, resulting in a degradation of image quality. The microstructure, light-scattering properties, and effects on image contrast and resolution of some relevant antiglare structures are examined. A model based on scalar diffraction theory that relates the various optical properties to the surface microstructure is presented.

© 1994 Optical Society of America

History
Original Manuscript: August 9, 1993
Revised Manuscript: December 8, 1993
Published: June 20, 1994

Citation
A. M. Nuijs and J. J. L. Horikx, "Diffraction and scattering at antiglare structures for display devices," Appl. Opt. 33, 4058-4068 (1994)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-33-18-4058


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References

  1. H. Kawamura, T. Kawamura, K. Kobara, Y. Endo, “Image display having antistatic film with transparent and electroconductive properties and process for processing same,” U.S. patent4,945,282 (8December1988).
  2. J. M. Bennet, L. Mattson, Introduction to Surface Roughness and Scattering (Optical Society of America, Washington, D.C., 1989).
  3. J. W. Goodman, Introduction to Fourier Optics (McGraw-Hill, New York, 1968), Chap. 4, pp. 57–76.
  4. J. W. Goodman, Statistical Optics (Wiley, New York, 1985), Chap. 3, p. 74.
  5. A. L. G. van den Eeden, A. A. S. Sluyterman, “Colour monitor tubes with magnetic-field suppression and antistatic coating,” Electron. Components Appl. 10, 48–52 (1990).
  6. A. J. den Boef, “Scanning force microscopy using optical interferometry,” Ph.D. dissertation (University of Twente, Enschede, The Netherlands, 1991).
  7. P. Beckmann, “Scattering of light by rough surfaces,” in Progress in Optics, E. Wolf, ed. (North-Holland, Amsterdam, 1967), Vol. 6, pp. 53–69. [CrossRef]

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