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Applied Optics

Applied Optics


  • Vol. 33, Iss. 19 — Jul. 1, 1994
  • pp: 4137–4142

Real-time displacement measurement using a multicamera phase-stepping speckle interferometer

Arjan J. P. van Haasteren and Hans J. Frankena  »View Author Affiliations

Applied Optics, Vol. 33, Issue 19, pp. 4137-4142 (1994)

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Surface point displacements can be measured by using standard phase-stepping speckle interferometry, but the measured data are vulnerable to disturbances during the interferogram recordings. To overcome this an interferometer with a computational system has been developed to record three phase-stepped interferograms simultaneously and to calculate displacements. This system is evaluated by measurements of the out-of-plane rotation of a flat surface. The surface displacement is calculated at a rate of 25 times/s. If one reduces noise by filtering, hardware limitations decrease the speed to 12.5 displacement calculations/s. With this system displacements can be measured with an accuracy exceeding λ/55 if filtering is applied.

© 1994 Optical Society of America

Original Manuscript: February 10, 1993
Revised Manuscript: April 27, 1993
Published: July 1, 1994

Arjan J. P. van Haasteren and Hans J. Frankena, "Real-time displacement measurement using a multicamera phase-stepping speckle interferometer," Appl. Opt. 33, 4137-4142 (1994)

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  1. J. A. Leendertz, “Interferometric displacement measurement on scattering surfaces utilizing speckle effect,” J. Phys. E 3, 214–218 (1970). [CrossRef]
  2. E. Archbold, J. M. Burch, A. E. Ennos, “Recording of in-plane surface displacement by double-exposure speckle photography,” Opt. Acta 17, 883–898 (1970). [CrossRef]
  3. J. N. Butters, R. Jones, C. Wykes, “Electronic speckle pattern interferometry,” in Speckle Metrology, R. K. Erf, ed. (Academic, New York, 1978), pp. 111–158.
  4. C. Wykes, “Use of electronic speckle pattern interferometry in measurement of static and dynamic surface displacements,” Opt. Eng. 21, 400–406 (1982).
  5. D. W. Robinson, D. C. Williams, “Digital phase stepping speckle interferometry,” Opt. Commun. 57, 26–30 (1986). [CrossRef]
  6. K. Creath, “Phase-shifting speckle interferometry,” Appl. Opt. 24, 3053–3058 (1985). [CrossRef] [PubMed]
  7. M.-W. Chang, C.-P. Hu, P. S. Lam, J. C. Wyant, “High precision deformation measurement by digital phase shifting holographic interferometry,” Appl. Opt. 24,3780–3783 (1985). [CrossRef] [PubMed]
  8. B. Breuckmann, W. Thieme, “Computer-aided analysis of holographic interferograms using the phase-shift method,” Appl. Opt. 24, 2145–2149 (1985). [CrossRef] [PubMed]
  9. W. Jüptner, T. M. Kreis, H. Kreitlow, “Automatic evaluation of holographic interferograms by reference beam phase shifting,” in Industrial Applications of Laser Technology, W. F. Fagan, ed., Proc. Soc. Photo-Opt. Instrum. Eng 398, 22–29 (1983).
  10. K. Creath, “Phase-measurement interferometric techniques,” in Progress in Optics, E. Wolf, ed. (Elsevier, Amsterdam, 1988), Vol. 26, pp. 349–393. [CrossRef]
  11. M. P. Kothiyal, C. Delisle, “Shearing interferometer for phase shifting interferometry with polarization phase shifter,” Appl. Opt. 24, 4439–4442 (1985). [CrossRef] [PubMed]
  12. M. Born, E. Wolf, Principles of Optics (Pergamon, Oxford, 1980).
  13. A. E. Ennos, “Speckle interferometry,” in Laser Speckle and Related Phenomena, J. C. Dainty, ed. (Springer-Verlag, Berlin, 1975), pp. 203–253. [CrossRef]
  14. D. Colucci, P. L. Wizinowich, “Millisecond phase acquisition at video rates,” Appl. Opt. 31, 5919–5925 (1992). [CrossRef] [PubMed]
  15. H. A. Vrooman, A. A. M. Maas, “New image processing algorithms for the analysis of speckle pattern interferograms,” in Fringe Pattern Analysis, G. T. Reid, ed., Proc. Soc. Photo-Opt. Instrum. Eng. 1163, 51–61 (1989).
  16. S. Donati, G. Martini, “Speckle-pattern intensity and phase: second-order conditional statistics,” J. Opt. Soc. Am 69, 1690–1694(1979). [CrossRef]
  17. J. W. Goodman, “Statistical properties of laser speckle patterns,” in Laser Speckle and Related Phenomena, J. C. Dainty, ed. (Springer-Verlag, Berlin, 1975), pp. 9–75. [CrossRef]
  18. R. Höfling, Frauenhofer Institut für Umvormtechnik, Chemnitz, Germany (personal communication, 1993).

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