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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 33, Iss. 19 — Jul. 1, 1994
  • pp: 4137–4142

Real-time displacement measurement using a multicamera phase-stepping speckle interferometer

Arjan J. P. van Haasteren and Hans J. Frankena  »View Author Affiliations


Applied Optics, Vol. 33, Issue 19, pp. 4137-4142 (1994)
http://dx.doi.org/10.1364/AO.33.004137


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Abstract

Surface point displacements can be measured by using standard phase-stepping speckle interferometry, but the measured data are vulnerable to disturbances during the interferogram recordings. To overcome this an interferometer with a computational system has been developed to record three phase-stepped interferograms simultaneously and to calculate displacements. This system is evaluated by measurements of the out-of-plane rotation of a flat surface. The surface displacement is calculated at a rate of 25 times/s. If one reduces noise by filtering, hardware limitations decrease the speed to 12.5 displacement calculations/s. With this system displacements can be measured with an accuracy exceeding λ/55 if filtering is applied.

© 1994 Optical Society of America

History
Original Manuscript: February 10, 1993
Revised Manuscript: April 27, 1993
Published: July 1, 1994

Citation
Arjan J. P. van Haasteren and Hans J. Frankena, "Real-time displacement measurement using a multicamera phase-stepping speckle interferometer," Appl. Opt. 33, 4137-4142 (1994)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-33-19-4137


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References

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