Abstract

We have constructed two-wavelength phase-shifting interferometry that is insensitive to the intensity changes in interferograms associated with the current variations in two laser-diode (LD) sources by using a newly developed phase-extraction algorithm. The tested phase at a synthetic wavelength can be measured from six interferograms with different phase shifts. The algorithm becomes a simple form for seven interferograms and reduces to a minimum of five phase-shifted data in the proper conditions. We shifted the phases equally in opposite directions to one another by separately varying the stepwise currents in dual LD’s on an unbalanced interferometer. The measurement accuracy has been improved compared with that of the two-wavelength four-step method. The phase error caused by the power changes in the dual LD’s has been investigated theoretically and experimentally. The experimental results are shown to measure a step object with a 4.6-μm synthetic wavelength.

© 1994 Optical Society of America

Phase-extraction analysis of laser-diode phase-shifting interferometry that is insensitive to changes in laser power

Ribun Onodera and Yukihiro Ishii
J. Opt. Soc. Am. A 13(1) 139-146 (1996)

Two-wavelength phase-shifting interferometry with a superimposed grating displayed on an electrically addressed spatial light modulator

Youichi Bitou
Appl. Opt. 44(9) 1577-1581 (2005)

Two-wavelength laser-diode interferometry that uses phase-shifting techniques

Yukihiro Ishii and Ribun Onodera
Opt. Lett. 16(19) 1523-1525 (1991)

Two-wavelength interferometry that uses a Fourier-transform method

Ribun Onodera and Yukihiro Ishii
Appl. Opt. 37(34) 7988-7994 (1998)

Phase-shifting laser diode interferometer using pulse modulation

Takamasa Suzuki, Tsubasa Adachi, Osami Sasaki, and Samuel Choi
Appl. Opt. 51(18) 4109-4112 (2012)