Abstract

In this paper we discuss an oblique incidence and observation electronic speckle-pattern interferometer, in which we use an anamorphic prism in front of the object. A collimated beam traveling through the prism is partly reflected at the base of the prism. The reflected light is the reference beam and the transmitted light illuminates the diffuse object, thereby generating the object beam. In this scheme the object and the reference beams are collinear. A new scheme that uses two prisms and permits phase stepping is also presented.

© 1994 Optical Society of America

Increased sensitivity to in-plane displacements in electronic speckle pattern interferometry

C. Joenathan, A. Sohmer, and L. Bürkle
Appl. Opt. 34(16) 2880-2885 (1995)

Additive–subtractive phase-modulated electronic speckle interferometry: analysis of fringe visibility

Bruno F. Pouet and Sridhar Krishnaswamy
Appl. Opt. 33(28) 6609-6616 (1994)

Digital processing of electronic speckle pattern interferometry addition fringes

A. Davila, D. Kerr, and G. H. Kaufmann
Appl. Opt. 33(25) 5964-5969 (1994)

Phase extraction from electronic speckle pattern interferometry addition fringes

Andrew J. Moore, John R. Tyrer, and Fernando Mendoza Santoyo
Appl. Opt. 33(31) 7312-7320 (1994)

Geometry for contouring by electronic speckle pattern interferometry based on shifting illumination beams

Y. Zou, H. Diao, X. Peng, and H. Tiziani
Appl. Opt. 31(31) 6616-6621 (1992)