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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 33, Iss. 31 — Nov. 1, 1994
  • pp: 7406–7411

Measurement of the wavelength dependence of birefringence for optical disk substrates

Hong Fu, Zheng Yan, and M. Mansuripur  »View Author Affiliations


Applied Optics, Vol. 33, Issue 31, pp. 7406-7411 (1994)
http://dx.doi.org/10.1364/AO.33.007406


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Abstract

The in-plane and vertical birefringence of polycarbonate plastic substrates of optical disks are measured for wavelengths between 360 and 860 nm, which covers the full range of interest for blue as well as for the current red and infrared recording. It is found that the birefringence generally decreases as the measurement wavelength is increased. In a typical case, the in-plane birefringence, Δn goes from 1.7 × 10−5 to 1.2 × 10−5, and the vertical birefringence, Δn, drops from 7.5 × 10−4 to 5.7 × 10−4 in the wavelength range from 360 to 860 nm.

© 1994 Optical Society of America

History
Original Manuscript: September 22, 1993
Revised Manuscript: March 30, 1994
Published: November 1, 1994

Citation
Hong Fu, Zheng Yan, and M. Mansuripur, "Measurement of the wavelength dependence of birefringence for optical disk substrates," Appl. Opt. 33, 7406-7411 (1994)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-33-31-7406


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References

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