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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 33, Iss. 7 — Mar. 1, 1994
  • pp: 1170–1175

Fast imaging microlenses

T. David Binnie  »View Author Affiliations


Applied Optics, Vol. 33, Issue 7, pp. 1170-1175 (1994)
http://dx.doi.org/10.1364/AO.33.001170


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Abstract

A new type of imaging microlens, primarily for use with solid-state image-capture systems such as a charge coupled device (CCD) or metal oxide semiconductor array sensors, is described. The design, having less aberration than conventional lenses of similar specification, is particularly advantageous in wide-angle, low-light applications. The lens type is substantially simpler than any existing design. A particular example, a fixed focus f/3.5 lens with a 90° field of view and a depth of field from 2 cm to infinity, is detailed. The lens can be directly bonded to a solid-state array detector and requires no other mechanical support. The lens can be designed and manufactured at low cost and has current applications in surveillance and microscopy.

© 1994 Optical Society of America

History
Original Manuscript: June 10, 1992
Revised Manuscript: June 16, 1993
Published: March 1, 1994

Citation
T. David Binnie, "Fast imaging microlenses," Appl. Opt. 33, 1170-1175 (1994)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-33-7-1170


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References

  1. D. Renshaw, P. B. Denyer, “ASIC vision,” in Proceedings of the IEEE 1990 Custom Integrated Circuits Conference (Institute of Electrical and Electronics Engineers, New York, 1990), pp. 3038–3041.
  2. D. Renshaw, P. B. Denyer, “ASIC image sensors,” in Proceedings of the IEEE International Symposium on Circuits and Systems (Institute of Electrical and Electronics Engineers, New York, 1990), pp. 7.3.1–7.3.4.
  3. The 2/3-in. closed-circuit television lens quoted is product stock number 625-132 (RS Components, Ltd., Corby NN17 9EL, U.K.).
  4. W. J. Smith, Modern Optical Engineering (McGraw-Hill, New York, 1966), Chap. 2, pp. 42–47.
  5. R. Kingslake, Lens Design Fundamentals (Academic, New York, 1978), Chap. 3, pp. 48–54.
  6. W. T. Welford, Aberrations of the Symmetrical Optical System (Academic, New York, 1974), Chap. 7, pp. 111–142.
  7. P. B. Denyer, D. Renshaw, A. Halaas, “On chip CMOS sensors for VLSI imaging systems,” in Proceedings of IFIP Technical Conference 10/WG 10.5 International Conference on Very Large Scale Integration, A. Halaas, P. B. Denyer, eds. (International Federation of Information Processing, Edinburgh, 1991), pp. 4b.1–4b.1.10.

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