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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 33, Iss. 7 — Mar. 1, 1994
  • pp: 1274–1278

Confocal scanning dark-field polarization microscopy

S. Kimura and T. Wilson  »View Author Affiliations


Applied Optics, Vol. 33, Issue 7, pp. 1274-1278 (1994)
http://dx.doi.org/10.1364/AO.33.001274


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Abstract

Dark-field imaging is attained by use of a λ/4 plate and an analyzer in a confocal scanning microscope. This dark-field microscope detects only the edge-diffracted wave whose polarization is different from that of the incident beam. The fact that images of photoresist patterns taken by the microscope show only the edges of the patterns confirms the dark-field nature of the imaging.

© 1994 Optical Society of America

History
Original Manuscript: September 8, 1992
Revised Manuscript: April 6, 1993
Published: March 1, 1994

Citation
S. Kimura and T. Wilson, "Confocal scanning dark-field polarization microscopy," Appl. Opt. 33, 1274-1278 (1994)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-33-7-1274


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References

  1. M. Born, E. Wolf, Principles of Optics (Pergamon, Oxford, 1980), p. 424.
  2. T. Wilson, C. Sheppard, Theory and Practice of Scanning Microscopy (Academic, London, 1984).
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  7. S. Inoué, Video Microscopy (Plenum, New York, 1986).
  8. Ref. 1, p.556.
  9. G. A. Deschamps, J. Boersma, S. Lee, “Three-dimensional half-plane diffraction: exact solution and testing of uniform theories,” IEEE Trans. Antennas Propag. AP-32, 264–271 (1984). [CrossRef]
  10. B. Richards, E. Wolf, “Electromagnetic diffraction in optical systems II. Structure of the image field in an aplanatic system,” Proc. Soc. London Ser. A 253, 358–379 (1959). [CrossRef]
  11. S. Inoué, W. L. Hyde, “Studies on depolarization of light at microscope lens surfaces. II. The simultaneous realization of high resolution and high sensitivity with the polarizing microscope,” J. Biophys. Biochem. 3, 831–838 (1957). [CrossRef]

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