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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 33, Iss. 8 — Mar. 10, 1994
  • pp: 1485–1490

Optoelectronic fuzzy inference system based on beam-scanning architecture

Hideo Itoh, Seiji Mukai, and Hiroyoshi Yajima  »View Author Affiliations


Applied Optics, Vol. 33, Issue 8, pp. 1485-1490 (1994)
http://dx.doi.org/10.1364/AO.33.001485


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Abstract

An approach for implementing a fuzzy inference system by the use of beam-scanning laser diodes is reported. Configurations of the inference system are proposed, and basic experiments of each processing unit are described. The feasibility of the inference technique is also discussed. A PRODUCT-SUM-gravity method of the inference technique is used instead of a conventional min-max-gravity method. Numerical simulation indicates that the PRODUCT-SUM-gravity method leads to higher controllability than the min-max-gravity method. A Gaussian that uses a far-field pattern of a laser diode is an envelope of the membership function. Features of optics, such as scanning the far-field beam and finding the center of gravity of an optical field, are used in the inference processes. Inference speed of the system is faster than several tens of mega-Flips (fuzzy logical inference per second) when one processing unit is used.

© 1994 Optical Society of America

Citation
Hideo Itoh, Seiji Mukai, and Hiroyoshi Yajima, "Optoelectronic fuzzy inference system based on beam-scanning architecture," Appl. Opt. 33, 1485-1490 (1994)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-33-8-1485

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