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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 34, Iss. 11 — Apr. 10, 1995
  • pp: 1923–1928

Holographic interferometry using two-wavelength holography for the measurement of large deformations

N. Ninane and M. P. Georges  »View Author Affiliations


Applied Optics, Vol. 34, Issue 11, pp. 1923-1928 (1995)
http://dx.doi.org/10.1364/AO.34.001923


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Abstract

Visible holographic interferometry is generally too sensitive for the measurement of large deformations. We present a holographic method that permits an increase in the range of measurable deformations. It requires the use of two different wavelengths, λ1 and λ2, and two holograms in series. We develop the theoretical basis of a method that permits the obtention of an interferogram as if a longer equivalent wavelength, λeq = λ1λ2/|λ1 − λ2|, were used. The method is experimentally tested by use of a setup that can be easily converted into a classical single-wavelength holographic interferometer, permitting comparison of the interferograms of the same deformation produced with both methods. Significant results are presented.

© 1995 Optical Society of America

History
Original Manuscript: April 11, 1994
Revised Manuscript: November 29, 1994
Published: April 10, 1995

Citation
N. Ninane and M. P. Georges, "Holographic interferometry using two-wavelength holography for the measurement of large deformations," Appl. Opt. 34, 1923-1928 (1995)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-34-11-1923


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