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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 34, Iss. 22 — Aug. 1, 1995
  • pp: 4812–4816

Emissivity measurements of reflective surfaces at near-millimeter wavelengths

J. J. Bock, M. K. Parikh, M. L. Fischer, and A. E. Lange  »View Author Affiliations


Applied Optics, Vol. 34, Issue 22, pp. 4812-4816 (1995)
http://dx.doi.org/10.1364/AO.34.004812


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Abstract

We have developed an instrument for directly measuring the emissivity of reflective surfaces at near-millimeter wavelengths. The thermal emission of a test sample is compared with that of a reference surface, allowing the emissivity of the sample to be determined without heating. The emissivity of the reference surface is determined by one’s heating the reference surface and measuring the increase in emission. The instrument has an absolute accuracy of Δ∊ = 5 × 10−4 and can reproducibly measure a difference in emissivity as small as Δ∊ = 10−4 between flat reflective samples. We have used the instrument to measure the emissivity of metal films evaporated on glass and carbon fiber-reinforced plastic composite surfaces. We measure an emissivity of (2.15 ± 0.4) × 10−3 for gold evaporated on glass and (2.65 ± 0.5) × 10−3 for aluminum evaporated on carbon fiber-reinforced plastic composite.

© 1995 Optical Society of America

History
Original Manuscript: October 31, 1994
Revised Manuscript: January 24, 1995
Published: August 1, 1995

Citation
J. J. Bock, M. K. Parikh, M. L. Fischer, and A. E. Lange, "Emissivity measurements of reflective surfaces at near-millimeter wavelengths," Appl. Opt. 34, 4812-4816 (1995)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-34-22-4812


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References

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