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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 34, Iss. 25 — Sep. 1, 1995
  • pp: 5699–5707

Multiple scattering in optical coherence microscopy

M. J. Yadlowsky, J. M. Schmitt, and R. F. Bonner  »View Author Affiliations


Applied Optics, Vol. 34, Issue 25, pp. 5699-5707 (1995)
http://dx.doi.org/10.1364/AO.34.005699


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Abstract

We show that the multiple-scatter rejection provided by optical coherence microscopy (low-coherence interferometry) can be incomplete in optically turbid media and that multiple scattering manifests itself in two distinct ways. Multiple small-angle scattering results in an effective probe field that is stronger than expected from a first-order beam extinction model, but that contains a distorted wave front that enhances the apparent reflectance of small structures relative to those that are larger than the unscattered incident beam. Multiple wide-angle scattering produces a broad diffuse haze that reduces the contrast of subsequent features.

© 1995 Optical Society of America

History
Original Manuscript: August 25, 1994
Revised Manuscript: March 31, 1995
Published: September 1, 1995

Citation
M. J. Yadlowsky, J. M. Schmitt, and R. F. Bonner, "Multiple scattering in optical coherence microscopy," Appl. Opt. 34, 5699-5707 (1995)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-34-25-5699

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