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Applied Optics

Applied Optics


  • Vol. 34, Iss. 31 — Nov. 1, 1995
  • pp: 7355–7360

Optical-constant calculation over an extended spectral region: application to titanium dioxide film

Shu-Chung Chiao, Bertrand G. Bovard, and H. A. Macleod  »View Author Affiliations

Applied Optics, Vol. 34, Issue 31, pp. 7355-7360 (1995)

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An iterative algorithm has been developed that takes starting values derived by an envelope method but then minimizes the influence of the envelopes and emphasizes the actual measured data. This combination avoids the difficulties inherent in the accurate drawing of the envelopes and makes it possible to extract the thickness and the optical constants of semiconducting and dielectric films over a wide spectral region, including regions of high absorption.

© 1995 Optical Society of America

Original Manuscript: January 12, 1995
Revised Manuscript: June 9, 1995
Published: November 1, 1995

Shu-Chung Chiao, Bertrand G. Bovard, and H. A. Macleod, "Optical-constant calculation over an extended spectral region: application to titanium dioxide film," Appl. Opt. 34, 7355-7360 (1995)

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