Color ellipsoscope for real-time imaging of nanometer-scale surface phenomena
Applied Optics, Vol. 34, Issue 4, pp. 729-731 (1995)
http://dx.doi.org/10.1364/AO.34.000729
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Abstract
An imaging method was developed based on null ellipsometry with a white-light source. It is useful for visualizing the kinetics of fast surface phenomena on the nanometer scale.
© 1995 Optical Society of America
Citation
Eiki Adachi, Hideyuki Yoshimura, and Kuniaki Nagayama, "Color ellipsoscope for real-time imaging of nanometer-scale surface phenomena," Appl. Opt. 34, 729-731 (1995)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-34-4-729
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