An imaging method was developed based on null ellipsometry with a white-light source. It is useful for visualizing the kinetics of fast surface phenomena on the nanometer scale.
© 1995 Optical Society of America
Eiki Adachi, Hideyuki Yoshimura, and Kuniaki Nagayama, "Color ellipsoscope for real-time imaging of nanometer-scale surface phenomena," Appl. Opt. 34, 729-731 (1995)