Computer codes that are based on Elson’s theory for light scattering by interfacial roughness in multilayer coatings were used to predict the bidirectional reflectance-distribution function (BRDF) of several opaque coatings from surface-roughness profiles measured by either a scanning–tunneling microscope or an atomic-force microscope. The predictions usually agreed with measured BRDF values to within a factor of 2. The coatings consisted of single layers of Ag or Ni and dielectric stacks with up to three layers.
© 1995 Optical Society of America
Original Manuscript: November 23, 1993
Revised Manuscript: August 1, 1994
Published: March 1, 1995
William M. Bruno, James A. Roth, Philip E. Burke, William B. Hewitt, Randal E. Holmbeck, and Dennis G. Neal, "Prediction of the bidirectional reflectance-distribution function from atomic-force and scanning–tunneling microscope measurements of interfacial roughness," Appl. Opt. 34, 1229-1238 (1995)