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Applied Optics

Applied Optics


  • Vol. 35, Iss. 1 — Jan. 1, 1996
  • pp: 113–116

Incoherent transmissivity and reflectivity of an absorbing-plane plate or layer with linear variations in thickness

D. B. Kushev and N. N. Zheleva  »View Author Affiliations

Applied Optics, Vol. 35, Issue 1, pp. 113-116 (1996)

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The normal-incidence transmissivity and reflectivities (front and back) for the incoherent case are calculated for an absorbing-plane sample with linear variation of the thickness. Closed-form expressions for the direct determination of the energy (intensity) coefficients of a free-standing sample and of a film on a transparent substrate are given. The results are illustrated with the simulated infrared spectra of semiconductor InSb films of different thicknesses.

© 1996 Optical Society of America

Original Manuscript: March 20, 1995
Revised Manuscript: August 1, 1995
Published: January 1, 1996

D. B. Kushev and N. N. Zheleva, "Incoherent transmissivity and reflectivity of an absorbing-plane plate or layer with linear variations in thickness," Appl. Opt. 35, 113-116 (1996)

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  1. D. B. Kushev, “Influence of finite spectral width on the interference spectra of a thin absorbing film on a transparent substrate,” Infrared Phys. Technol. (to be published).
  2. D. B. Kushev, N. N. Zheleva, “Transmittivity, reflectivities and absorptivities of semiconductor film with linear variation in thickness,” J. Phys. D 28, 1239–1243 (1995). [CrossRef]
  3. D. Siapkas, D. B. Kushev, N. N. Zheleva, J. Siapkas, I. Lelidis, “Optical constants of tin telluride determined from infrared interference spectra,” Infrared Phys. 31, 425–433 (1991). [CrossRef]
  4. E. E. Bell, “Optical constants and their measurements,” in Encyclopedia of Physics, S. Flügge, ed. (Springer-Verlag, Berlin, 1967), Vol. 25, Part 2a, pp. 1–58.

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