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Applied Optics

Applied Optics


  • Vol. 35, Iss. 1 — Jan. 1, 1996
  • pp: 117–119

Ambiguities in determining the optical constants for two reflection methods

P. C. Logofǎtu, D. Apostol, V. Damian, and R. Tumbar  »View Author Affiliations

Applied Optics, Vol. 35, Issue 1, pp. 117-119 (1996)

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The Darcie–Whalen reflection method is ambiguous and has a chart area of 72%, which is less sensitive than method H—Owen's classification—which is unambiguous and has a chart area of 100%.

© 1996 Optical Society of America

Original Manuscript: March 22, 1995
Revised Manuscript: September 13, 1995
Published: January 1, 1996

P. C. Logofǎtu, D. Apostol, V. Damian, and R. Tumbar, "Ambiguities in determining the optical constants for two reflection methods," Appl. Opt. 35, 117-119 (1996)

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  1. S. P. F. Humphreys-Owen, “Comparison of reflection methods for measuring optical constants without polarimetric analysis, and proposal for new methods based on the Brewster angle,” Proc. Phys. Soc. London77, 949–957 (1961). [CrossRef]
  2. T. E. Darcie, M. S. Whalen, “Determination of optical constants using pseudo-Brewster angle and normal incidence reflectance measurements,” Appl. Opt. 23, 1130–1131 (1984). [CrossRef] [PubMed]
  3. R. F. Miller, A. J. Taylor, L. S. Julien, “The optimum angle of incidence for determining optical constants from reflectance measurements,” J. Phys. D 3, 1957–1961 (1970). [CrossRef]
  4. D. G. Avery, “An improved method for measurements of optical constants by reflection,” Proc. Phys. Soc. London Sect. B65, 425–428 (1952). [CrossRef]
  5. I. Šimon, “Spectroscopy in infrared by reflection and its use for highly absorbing substances,” J. Opt. Am. 41, 336–345 (1951). [CrossRef]

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