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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 35, Iss. 1 — Jan. 1, 1996
  • pp: 61–64

Phase error calculation in a Fizeau interferometer by Fourier expansion of the intensity profile

B. V. Dorrío, J. Blanco-García, C. López, A. F. Doval, R. Soto, J. L. Fernández, and M. Pérez-Amor  »View Author Affiliations


Applied Optics, Vol. 35, Issue 1, pp. 61-64 (1996)
http://dx.doi.org/10.1364/AO.35.000061


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Abstract

The spectrum of the intensity profile of multiple-beam Fizeau interferograms is presented. Knowledge of this spectrum provides valuable information about the characteristics of Fizeau interferograms, allowing one to calculate the phase error when the Fizeau profile is evaluated by means of two-beam phase-stepping algorithms, as is usual for low-reflectivity coefficients.

© 1996 Optical Society of America

History
Original Manuscript: May 11, 1995
Revised Manuscript: September 15, 1995
Published: January 1, 1996

Citation
B. V. Dorrío, J. Blanco-García, C. López, A. F. Doval, R. Soto, J. L. Fernández, and M. Pérez-Amor, "Phase error calculation in a Fizeau interferometer by Fourier expansion of the intensity profile," Appl. Opt. 35, 61-64 (1996)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-35-1-61


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References

  1. J. E. Greivenkamp, J. H. Bruning, “Phase shifting interferometers,” in Optical Shop Testing, D. Malacara, ed. (Interscience, New York, 1992), pp. 501–598.
  2. K. Creath, “Temporal phase measurement method,” in Interferogram Analysis, D. W. Robinson, G. T. Reid, eds. (Institute of Physics, Bristol, UK, 1993), pp. 94–140.
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  6. I. S. Gradshteyn, I. M. Ryzhik, Tables of Integrals, Series and Products, A. Jeffrey, ed. (Academic, London, 1994), p. 366
  7. M. Born, E. Wolf, Principles of Optics (Pergamon, London, 1975), p. 285
  8. K. G. Larkin, B. F. Oreb, “Design and assessment of symmetrical phase-shifting algorithms,” J. Opt. Soc. Am. A 9, 1740–1748 (1992). [CrossRef]

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