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Applied Optics

Applied Optics


  • Vol. 35, Iss. 15 — May. 20, 1996
  • pp: 2602–2609

Accurate method for determining the refractive-index profiles of planar waveguides in uniaxial media with the optical axis normal to the surface

Jesper Falden Offersgaard, Torben Veng, and Torben Skettrup  »View Author Affiliations

Applied Optics, Vol. 35, Issue 15, pp. 2602-2609 (1996)

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A new method for characterization of uniaxial planar waveguides from their measured effective mode indices is presented. The theory is outlined and expressions for efficient computer analysis are given. Uniaxial waveguide samples have been made in c-cut LiNbO3 by proton exchange with and without post annealing in order to test the method on both steplike and graded-index profiles. The resulting characterization of the samples is discussed in relation to the inverse WKB method. Finally, the importance of incorporating the effects of material birefringence in the characterization of these kinds of waveguides is investigated.

© 1996 Optical Society of America

Original Manuscript: June 22, 1995
Revised Manuscript: November 7, 1995
Published: May 20, 1996

Jesper Falden Offersgaard, Torben Veng, and Torben Skettrup, "Accurate method for determining the refractive-index profiles of planar waveguides in uniaxial media with the optical axis normal to the surface," Appl. Opt. 35, 2602-2609 (1996)

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