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Applied Optics

Applied Optics


  • Vol. 35, Iss. 16 — Jun. 1, 1996
  • pp: 2947–2954

Ghosts and artifacts in Fourier-transform spectrometry

R. C. M. Learner, A. P. Thorne, and J. W. Brault  »View Author Affiliations

Applied Optics, Vol. 35, Issue 16, pp. 2947-2954 (1996)

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Ghosts in Fourier-transform spectrometry are important for three reasons: they can give rise to spurious coincidences of frequency differences in spectral analysis, distort the phase correction, and set a limit to the attainable signal-to-noise ratio. The various types of ghost, originating from amplitude modulation, phase modulation, and intermodulation, are described and discussed, together with some hardware and software artifacts. Recipes are given for identifying these features and, where possible, avoiding harmful effects from them.

© 1996 Optical Society of America

Original Manuscript: August 7, 1995
Revised Manuscript: December 22, 1995
Published: June 1, 1996

R. C. M. Learner, A. P. Thorne, and J. W. Brault, "Ghosts and artifacts in Fourier-transform spectrometry," Appl. Opt. 35, 2947-2954 (1996)

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