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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 35, Iss. 19 — Jul. 1, 1996
  • pp: 3525–3533

Dual-wavelength heterodyne differential interferometer for high-precision measurements of reflective aspherical surfaces and step heights

H. J. Tiziani, A. Rothe, and N. Maier  »View Author Affiliations


Applied Optics, Vol. 35, Issue 19, pp. 3525-3533 (1996)
http://dx.doi.org/10.1364/AO.35.003525


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Abstract

A dual-wavelength heterodyne differential interferometer was developed and tested together with scanning mechanics. To extend the range of unambiguity, two wavelengths were applied. This is important for measuring structures with surface discontinuities (reliefs, steps). The automatic adjustment of the interferometer with respect to the rotational symmetrical measuring surfaces (aspheres) is important. An adjustment is needed to scan the asphere through its vertex. Typical measurements on a sphere, an asphere, and steps are shown.

© 1996 Optical Society of America

History
Original Manuscript: November 20, 1995
Published: July 1, 1996

Citation
H. J. Tiziani, A. Rothe, and N. Maier, "Dual-wavelength heterodyne differential interferometer for high-precision measurements of reflective aspherical surfaces and step heights," Appl. Opt. 35, 3525-3533 (1996)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-35-19-3525


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References

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