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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 35, Iss. 22 — Aug. 1, 1996
  • pp: 4404–4407

Stability under vacuum of silicon trap detectors and their use as transfer instruments in cryogenic radiometry

R. Goebel, S. Yilmaz, and R. Köhler  »View Author Affiliations


Applied Optics, Vol. 35, Issue 22, pp. 4404-4407 (1996)
http://dx.doi.org/10.1364/AO.35.004404


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Abstract

The stability of the responsivity of trap detectors under vacuum has been studied by means of a special chamber designed for the test of photodetectors at low pressure. The first experiments at a wavelength of 647 nm show that the responsivity variations are smaller than the uncertainties of the measurements, approximately 3 parts in 105, when the detector operates successively in air, under vacuum, and then again in air. Calculations based on experiments with single windowless photodiodes indicate that the change in trap responsivity that is due to vacuum effects should be smaller than 1 part in 105, at least in the visible part of the wavelength range. This stability makes trap detectors suitable for cryogenic radiometry when one uses transfer detectors under vacuum.

© 1996 Optical Society of America

History
Original Manuscript: November 10, 1995
Revised Manuscript: January 29, 1996
Published: August 1, 1996

Citation
R. Goebel, S. Yilmaz, and R. Köhler, "Stability under vacuum of silicon trap detectors and their use as transfer instruments in cryogenic radiometry," Appl. Opt. 35, 4404-4407 (1996)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-35-22-4404

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