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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 35, Iss. 22 — Aug. 1, 1996
  • pp: 4408–4412

Reflectance of a wideband multilayer x-ray mirror at normal and grazing incidences

J. F. Seely, M. P. Kowalski, W. R. Hunter, and G. Gutman  »View Author Affiliations


Applied Optics, Vol. 35, Issue 22, pp. 4408-4412 (1996)
http://dx.doi.org/10.1364/AO.35.004408


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Abstract

The reflectance of a W–B4C multilayer mirror, with a period thickness that increased with depth into the multilayer, was measured at near-normal incidence with synchrotron radiation and at grazing incidence with Cu Kα radiation. The period thickness increased linearly from 17.9 Å at the top of the multilayer structure to 21.9 Å at the substrate while the same ratio of nodal layer to period thickness was maintained. For a grazing angle of 80° (10° from normal incidence), the peak reflectance was 1.1% at a wavelength of 36 Å, and the reflectance profile was 1 Å wide. For Cu Kα radiation the reflectance peaked at a grazing angle of 2.4° and was 0.4° wide. Compared with a W–B4C multilayer mirror with a constant period thickness, the depth-graded multilayer mirror has wider reflectance profiles at near-normal and grazing incidences, resulting in larger integrated reflectances and wider fields of view.

© 1996 Optical Society of America

History
Original Manuscript: October 30, 1995
Published: August 1, 1996

Citation
J. F. Seely, M. P. Kowalski, W. R. Hunter, and G. Gutman, "Reflectance of a wideband multilayer x-ray mirror at normal and grazing incidences," Appl. Opt. 35, 4408-4412 (1996)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-35-22-4408


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References

  1. O. S. Heavens, H. M. Liddell, “Staggered broad-band reflecting multilayers,” Appl. Opt. 5, 373–376 (1966). [CrossRef] [PubMed]
  2. D. J. Nagel, J. V. Gilfrich, T. W. Barbee, “Bragg diffractors with graded-thickness multilayers,” Nucl. Instrum. Methods 195, 63–65 (1982). [CrossRef]
  3. J. F. Meekins, R. G. Cruddace, H. Gursky, “Optimization of layered synthetic microstructures for narrowband reflectivity at soft x-ray and EUV wavelengths,” Appl. Opt. 25, 2757–2763 (1986). [CrossRef] [PubMed]
  4. J. F. Meekins, R. G. Cruddace, H. Gursky, “Optimization of layered synthetic microstructures for broadband reflectivity at soft x-ray and EUV wavelengths,” Appl. Opt. 26, 990–994 (1987). [CrossRef] [PubMed]
  5. E. Gu, G. V. Marr, M. A. Player, “Optimization of reflectivity of periodic and quasiperiodic multilayer films at soft x-ray wavelengths,” Opt. Commun. 77, 99–106 (1990). [CrossRef]
  6. F. Mezei, “Novel polarized neutron devices: supermirror and spin component amplifier,” Commun. Phys. 1, 81 (1976).
  7. J. Wood, “Status of supermirror research at OSMC,” in Neutron Optical Devices and Applications, C. F. Majkrzak, J. L. Wood, ed., Proc. SPIE1738, 22 (1992).
  8. S. P. Vernon, D. G. Stearns, R. S. Rosen, “Chirped multilayer coatings for increased x-ray throughput,” Opt. Lett. 18, 672–674 (1993). [CrossRef] [PubMed]
  9. K. D. Joensen, P. Hoghoj, F. Christenson, P. Gorenstein, J. Susini, E. Ziegler, A. Freund, J. Wood, “Multilayered supermirror structures for hard x-ray synchrotron and astrophysics instrumentation,” in Multilayer and Grazing Incidence X-Ray/EUV Optics II, R. B. Hoover, A. B. Walker, ed., Proc. SPIE2011, 360–372 (1993).
  10. A. F. Jankowski, D. M. Makowiecki, “Manufacture, structure and performance of W–B4C multilayer x-ray mirrors,” in X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers, F. E. Christensen, ed., Proc. SPIE984, 64–74 (1988).
  11. A. F. Jankowski, L. R. Schrawyer, M. A. Wall, W. W. Craig, R. I. Morales, D. M. Makowiecki, “Interfacial bonding in W/C and W/B4C multilayers,” J. Vac. Sci. Technol. A 7, 2914–2918 (1989). [CrossRef]
  12. J. F. Seely, G. Gutman, J. Wood, G. S. Herman, M. P. Kowalski, J. C. Rife, W. R. Hunter, “Normal-incidence reflectance of W/B4C multilayer mirrors in the 34–50 Å wavelength region,” Appl. Opt. 32, 3541–3543 (1993). [CrossRef] [PubMed]
  13. W. R. Hunter, R. T. Williams, J. C. Rife, J. P. Kirkland, M. N. Kabler, “A grating/crystal monochromator for the spectral range 5 eV to 5 keV,” Nucl. Instrum. Methods 195, 141–153 (1982). [CrossRef]
  14. W. R. Hunter, J. C. Rife, “An ultrahigh vacuum reflectometer/goniometer for use with synchrotron radiation,” Nucl. Instrum. Methods A 246, 465–468 (1986). [CrossRef]
  15. J. C. Rife, H. R. Sadeghi, W. R. Hunter, “Upgrades and recent performance of the grating/crystal monochromator,” Rev. Sci. Instrum. 60, 2064–2067 (1989). [CrossRef]
  16. M. P. Kowalski, R. G. Cruddace, J. F. Seely, J. C. Rife, W. R. Hunter, “Uncertainties in reflectance measurements made on the NRL beamline X24C,” NRL Memorandum Rep. 7620-95-7738 (Naval Research Laboratory, Washington, D.C., 1995).
  17. B. L. Henke, E. M. Gullikson, J. C. Davis, “X-ray interactions: photoabsorption, scattering, transmission, and reflection at E=50–30,000 eV, Z=1–92,” At. Data Nucl. Data Tables 54, 181–342 (1993). [CrossRef]

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