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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 35, Iss. 25 — Sep. 1, 1996
  • pp: 5013–5020

Light-induced refractive-index modifications in dielectric thin films: experimental determination of relaxation time and amplitude

S. Monneret, S. Tisserand, F. Flory, and H. Rigneault  »View Author Affiliations


Applied Optics, Vol. 35, Issue 25, pp. 5013-5020 (1996)
http://dx.doi.org/10.1364/AO.35.005013


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Abstract

A two-beam setup based on the totally reflecting prism coupler is shown to be a powerful means of characterizing light-induced refractive-index modifications in dielectric thin films. Rise and relaxation times and amplitudes of thin-film refractive-index variations can be measured. Some developments of the electromagnetic theory of prism coupling are presented for Gaussian incident beams. Measurements made on a single Ta2O5 layer deposited on a silica glass are presented. Relaxation times of a few milliseconds reveal the thermal origin of the phenomena. The thermal nonlinear coefficient of this Ta2O5 layer is nearly 10−15 m2/W.

© 1996 Optical Society of America

History
Original Manuscript: November 20, 1995
Revised Manuscript: February 21, 1996
Published: September 1, 1996

Citation
S. Monneret, S. Tisserand, F. Flory, and H. Rigneault, "Light-induced refractive-index modifications in dielectric thin films: experimental determination of relaxation time and amplitude," Appl. Opt. 35, 5013-5020 (1996)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-35-25-5013


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