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Applied Optics

Applied Optics


  • Vol. 35, Iss. 25 — Sep. 1, 1996
  • pp: 5013–5020

Light-induced refractive-index modifications in dielectric thin films: experimental determination of relaxation time and amplitude

S. Monneret, S. Tisserand, F. Flory, and H. Rigneault  »View Author Affiliations

Applied Optics, Vol. 35, Issue 25, pp. 5013-5020 (1996)

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A two-beam setup based on the totally reflecting prism coupler is shown to be a powerful means of characterizing light-induced refractive-index modifications in dielectric thin films. Rise and relaxation times and amplitudes of thin-film refractive-index variations can be measured. Some developments of the electromagnetic theory of prism coupling are presented for Gaussian incident beams. Measurements made on a single Ta2O5 layer deposited on a silica glass are presented. Relaxation times of a few milliseconds reveal the thermal origin of the phenomena. The thermal nonlinear coefficient of this Ta2O5 layer is nearly 10−15 m2/W.

© 1996 Optical Society of America

Original Manuscript: November 20, 1995
Revised Manuscript: February 21, 1996
Published: September 1, 1996

S. Monneret, S. Tisserand, F. Flory, and H. Rigneault, "Light-induced refractive-index modifications in dielectric thin films: experimental determination of relaxation time and amplitude," Appl. Opt. 35, 5013-5020 (1996)

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  1. P. K. Tien, R. Ulrich, R. J. Martin, “Modes of propagating light waves in thin deposited semiconductor films,” Appl. Phys. Lett. 14, 291–294 (1969). [CrossRef]
  2. R. Ulrich, R. Torge, “Measurement of thin film parameters with a prism coupler,” Appl. Opt. 12, 2901–2908 (1973). [CrossRef] [PubMed]
  3. P. K. Tien, R. Ulrich, “Theory of prism-film coupler and thin-film light guides,” J. Opt. Soc. Am. 60, 1325–1337 (1970). [CrossRef]
  4. R. Ulrich, “Theory of prism-film coupler by plane wave analysis,” J. Opt. Soc. Am. 60, 1337–1350 (1970). [CrossRef]
  5. H. Rigneault, F. Flory, S. Monneret, “Nonlinear totally reflecting prism coupler: thermomechanic effects and intensity-dependent refractive index of thin films,” Appl. Opt. 34, 4358–4368 (1995). [CrossRef] [PubMed]
  6. R. Petit, M. Cadillac, “Théorie électromagnétique du coupleur à prisme,” J. Opt. (Paris) 8, 41–49 (1977). [CrossRef]
  7. S. Patela, H. Jerominek, C. Delisle, R. Tremblay, “Nonlinear optical properties of thin-film waveguides deposited onto semiconductor-doped glasses,” J. Appl. Phys. 60, 1591–1594 (1986). [CrossRef]
  8. M. Bertolotti, A. Ferrari, C. Sibilia, G. Suber, D. Apostol, P. Jani, “Photothermal deflection technique for measuring thermal nonlinearities in semiconductor glasses,” Appl. Opt. 27, 1811–1813 (1988). [CrossRef] [PubMed]
  9. M. Bertolotti, E. Fazio, A. Ferrari, F. Michelotti, G. C. Righini, C. Sibilia, “Nonlinear coupling in a planar waveguide,” Opt. Lett. 15, 425–427 (1990). [CrossRef] [PubMed]
  10. H. K. Pulker, Coatings on Glass (Elsevier, Amsterdam, 1984), pp. 247–256.
  11. H. A. Macleod, Thin-Film Optical Filters (Hilger, Bristol, 1986), Chap. 2, pp. 11–40.
  12. J. Chilwell, I. Hodgkinson, “Thin-film field-transfer matrix theory of planar multilayer waveguides and reflection from prism-loaded waveguides,” J. Opt. Soc. Am. A 1, 742–753 (1984). [CrossRef]
  13. C. Falco, A. Azema, J. Botineau, D. B. Ostrowsky, “Infrared prism coupling characterization and optimization via near-field m-line scanning,” Appl. Opt. 21, 1847–1850 (1982). [CrossRef] [PubMed]
  14. J. T. Chilwell, “Prism coupler jig: interference fringes enable observation of the coupling gap,” Appl. Opt. 21, 1310–1319 (1982). [CrossRef] [PubMed]
  15. W. Lukosz, P. Pirani, V. Briguet, “Optical bistability by photothermal displacement in prism coupling into planar waveguides,” Opt. Lett. 12, 263–265 (1987). [CrossRef] [PubMed]
  16. M. Commandré, P. Roche, “Characterization of absorption by photothermal deflection,” in Thin Films for Optical Systems, F. Flory, ed., Vol. 49 of Optical Engineering Series (Dekker, New York, 1995), pp. 329–365.
  17. M. Commandré, P. Roche, Laboratoire d’Optique des Surfaces et des Couches Minces, Ecole Nationale Supérieure de Physique, 13397 Marseille Cedex 20, France (personal communication, 1995).
  18. F. Flory, H. Rigneault, N. Maythaveekulchai, F. Zamkotsian, “Characterization by guided wave of instabilities of optical coatings submitted to high-power flux: thermal and third-order nonlinear properties of dielectric thin films,” Appl. Opt. 32, 5628–5639 (1993). [CrossRef] [PubMed]

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