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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 35, Iss. 25 — Sep. 1, 1996
  • pp: 5040–5043

Determination of the refractive index and thickness of transparent pellicles by use of the polarization-independent absentee-layer condition

Y. Cui and R. M. A. Azzam  »View Author Affiliations


Applied Optics, Vol. 35, Issue 25, pp. 5040-5043 (1996)
http://dx.doi.org/10.1364/AO.35.005040


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Abstract

The refractive index and the thickness of a transparent pellicle are determined when the pellicle is placed between two vertical crossed polarizers and rotated in the horizontal plane. The transmission axes of the polarizers are neither parallel nor perpendicular to the plane of incidence. The light transmitted through the crossed polarizers reaches a minimum when the pellicle satisfies the absentee-layer condition. The refractive index and the film thickness are obtained from the pellicle orientation angles under such a condition.

© 1996 Optical Society of America

History
Original Manuscript: November 22, 1995
Revised Manuscript: February 22, 1996
Published: September 1, 1996

Citation
Y. Cui and R. M. A. Azzam, "Determination of the refractive index and thickness of transparent pellicles by use of the polarization-independent absentee-layer condition," Appl. Opt. 35, 5040-5043 (1996)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-35-25-5040


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References

  1. W. A. Pliskin, E. E. Conrad, “Nondestructive determination of thickness and refractive index of transparent films,” IBM J. Res. Dev. 8, 43–51 (1964). [CrossRef]
  2. F. Reizmann, W. Van Gelder, “Optical thickness measurement of SiO2–Si3N4 films on silicon,” Solid-State Electron. 10, 625–632 (1967). [CrossRef]
  3. R. M. A. Azzam, “Polarization-independent reflectance matching (PIRM). A technique for the determination of the refractive index and thickness of the transparent films,” J. Opt. (Paris) 8, 201–205 (1977). [CrossRef]
  4. T. Kihara, K. Yokomori, “Simultaneous measurement of the refractive index and thickness of thin films by polarized reflectances,” Appl. Opt. 29, 5069–5073 (1990). [CrossRef] [PubMed]
  5. T. Kihara, K. Yokomori, “Simultaneous measurement of the refractive index and thickness of thin films by S-polarized reflectances,” Appl. Opt. 31, 4482–4487 (1992). [CrossRef] [PubMed]
  6. R. M. A. Azzam, N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).
  7. Ref. 6, Chap. 5, p. 386.
  8. Pellicle samples provided by National Photocolor Corp., Mamaroneck, New York 10543.

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