OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 35, Iss. 25 — Sep. 1, 1996
  • pp: 5080–5084

Effects of surface compression strengthening on properties of indium tin oxide films deposited on automobile glass

Daoyang Huang, Fang C. Ho, and Robert R. Parsons  »View Author Affiliations


Applied Optics, Vol. 35, Issue 25, pp. 5080-5084 (1996)
http://dx.doi.org/10.1364/AO.35.005080


View Full Text Article

Enhanced HTML    Acrobat PDF (1098 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Indium tin oxide (ITO) films were deposited onto automobile glass substrates with dc reactive sputtering and ion-assisted e-beam-gun evaporation processes. The ITO-coated glass samples were then strengthened through a surface compression strengthening process that included heating the glass at 650 °C for 5 min and rapidly cooling the exterior of the hot glass with air jets. The deterioration of electrical and optical properties of the ITO films on automobile safety glass was found during the heating stage of the strengthening process. When a layer of SiO2 barrier was added, the property deterioration could be significantly reduced. The most effective barrier thickness was found near 60 nm, which resulted in no appreciable property loss.

© 1996 Optical Society of America

History
Original Manuscript: November 22, 1995
Revised Manuscript: March 4, 1996
Published: September 1, 1996

Citation
Daoyang Huang, Fang C. Ho, and Robert R. Parsons, "Effects of surface compression strengthening on properties of indium tin oxide films deposited on automobile glass," Appl. Opt. 35, 5080-5084 (1996)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-35-25-5080


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. N. J. Arfsten, “Sol-gel derived transparent IR-reflecting ITO semiconductor coatings and future applications,” J. Non-Cryst. Solids 63, 243–249 (1984). [CrossRef]
  2. R. Latz, K. Michael, M. Scherer, “High conducting large area indium tin oxide electrodes for displays prepared by DC magnetron sputtering,” Jpn. J. Appl. Phys. 30, L149–L151 (1991). [CrossRef]
  3. C. Schaefer, “Heatable automobile windshields with reduced energy transmission characteristics,” Glass 3 (11), 417–419 (1986).
  4. J. P. Brochot, D. Pillias, I. Wuest, J. P. Beaufays, M. Darmont, “Process for producing a transparent layer with low resistivity,” U.S. Patent5,011,585 (30Apr.1991).
  5. H. Harmand, J. F. Oudard, D. Bruneel, “Laminated glass with an electroconductive layer,” U.S. Patent5,324,374 (28June1994).
  6. Y. Shigesato, S. Takaki, T. Haranou, “Crystallinity and electrical properties of tin-doped indium oxide films deposited by DC magnetron sputtering,” Appl. Surf. Sci. 48/49, 269–275 (1991). [CrossRef]
  7. Y. Shigesato, Y. Hayashi, A. Masui, “The structural changes of indium tin oxide and a-WO3 films by introducing water to the deposition processes,” Jpn. J. Appl. Phys. 30, 814–819 (1991). [CrossRef]
  8. L. Bardos, M. Libra, “Effect of the oxygen absorption on properties of ITO layers,” Vacuum 39, 33–36 (1989). [CrossRef]
  9. T. Suzuki, T. Yamazaki, H. Oda, “Effects of the composition and thickness on the electrical properties of indium oxide/tin oxide multilayered films,” J. Mater. Sci. 24, 1383–1388 (1989). [CrossRef]
  10. Y. Kuo, “Characterization of indium tin oxide and reactive ion etched indium tin oxide surfaces,” Jpn. J. Appl. Phys. 29, 2243–2246 (1990). [CrossRef]
  11. H. Haitjema, J. J. Ph. Elich, “Physical properties of pyrolytically sprayed tin-doped indium oxide coatings,” Thin Solid Films 205, 93–100 (1993). [CrossRef]
  12. M. Higuchi, S. Uekusa, R. Nakano, K. Yokogawa, “Micrograin structure influence on electrical characteristics of sputtered indium tin oxide films,” J. Appl. Phys. 74, 6710–6713 (1993). [CrossRef]
  13. Y. Shigesato, D. C. Paine, “A microstructural study of low resistivity tin-doped indium oxide prepared by D. C. magnetron sputtering,” Thin Solid Films 238, 44–50 (1994). [CrossRef]
  14. R. Y. Tsai, M. Y. Hua, C. T. Wei, “Characterizations of composite TiO2–MgF2 films prepared by reactive ion-assisted coevaporation,” Opt. Eng. 33, 3411–3418 (1994). [CrossRef]
  15. J. C. Manifacier, J. P. Fillard, “Deposition of In2O3–SnO2 layers on glass substrates using a spraying method,” Thin Solid Films 77, 67–80 (1981). [CrossRef]
  16. R. E. Newnham, Structure-Property Relations (Springer-Verlag, New York, 1975), Chap. 3, p. 70.
  17. D. R. Clarke, “Stresses in thin films and characteristic failure modes,” in Optical Interference Coatings, Vol. 17 of 1995 OSA Technical Digest Series (Optical Society of America, Washington, D.C., 1995), paper ThA1.

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.


« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited