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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 35, Iss. 28 — Oct. 1, 1996
  • pp: 5484–5492

Implementation of a numerical needle method for thin-film design

Brian T. Sullivan and J. A. Dobrowolski  »View Author Affiliations


Applied Optics, Vol. 35, Issue 28, pp. 5484-5492 (1996)
http://dx.doi.org/10.1364/AO.35.005484


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Abstract

A variant of the powerful thin-film needle design technique, which was first described by Tikhonravov and his co-workers, is described. In this method thin layers are introduced at optimum positions within the refractive-index profile of a given multilayer system. In the original method the optimum locations for the layer insertions are calculated analytically, whereas in this variant of the method they are determined numerically. This approach, although somewhat slower, is very flexible. With the numerical needle method it is easy to define a merit function that consists of quite complex spectral quantities, such as Commission Internationale de l’Eclairage color coordinates or custom spectral properties that are defined at run time. In the program described, three different absorbing or nonabsorbing materials can be used for the needle layers and one or more needles can be inserted into the system at any given time. Multilayer solutions can also be sought in which the system is defined in terms of repeating groups of layers. It is also possible to calculate automatically a series of solutions to a particular problem with increasing overall thicknesses or to perform simultaneous calculations on several different systems. Examples are given that illustrate these various points.

© 1996 Optical Society of America

History
Original Manuscript: October 16, 1995
Revised Manuscript: January 22, 1996
Published: October 1, 1996

Citation
Brian T. Sullivan and J. A. Dobrowolski, "Implementation of a numerical needle method for thin-film design," Appl. Opt. 35, 5484-5492 (1996)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-35-28-5484


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References

  1. J. A. Dobrowolski, R. A. Kemp, “Refinement of optical multilayer systems with different optimization procedures,” Appl. Opt. 29, 2876–2893 (1990). [CrossRef] [PubMed]
  2. L. Li, J. A. Dobrowolski, “Computation speeds of different optical thin-film synthesis methods,” Appl. Opt. 31, 3790–3799 (1992). [CrossRef] [PubMed]
  3. A. V. Tikhonravov, “On the synthesis of optical coatings using optimality conditions,” Vestn. Mosk. Univ. Fiz. Astronomiya 23, 91–93 (1982).
  4. A. N. Baskakov, A. V. Tikhonravov, “Synthesis of two-component optical coatings,” Opt. Spectrosc. (USSR) 56, 559–562 (1984).
  5. A. V. Tikhonravov, “Optical coating synthesis using optimal conditions,” Vestn. Mosk. Univ. Fiz. Astromiya 23, 91–93 (1982).
  6. A. V. Tikhonravov, “On the optimality of thin film optical coating design,” in Optical Thin Films and Applications, R. Herrmann, ed., Proc. SPIE1270, 28–35 (1990).
  7. A. V. Tikhonravov, M. K. Trubetskov, “Thin film coating design using second order optimization methods,” in Thin Films for Optical Systems, K. H. Guenther, ed., Proc. SPIE1782, 156–164 (1992).
  8. A. V. Tikhonravov, “Some theoretical aspects of thin-film optics and their applications,” Appl. Opt. 32, 4265–4275 (1993). [CrossRef] [PubMed]
  9. G. W. DeBell, A. V. Tikhonravov, M. K. Trubetskov, “Use of a new synthesis algorithm to design polarization insensitive optical coatings,” in Optical Thin Films IV: New Developments, J. D. Rancourt, ed., Proc. SPIE2262, 187–197 (1994).
  10. A. V. Tikhonravov, M. K. Trubetskov, “Development of the needle optimization technique and new features of “Optilayer” design software,” in Optical Interference Coatings, F. Abelès, ed., Proc. SPIE2253, 10–20 (1994).
  11. J. A. Dobrowolski, “Completely automatic synthesis of optical thin film systems,” Appl. Opt. 4, 937–946 (1965). [CrossRef]
  12. S. A. Furman, A. V. Tikhonravov, Optics of Multilayer Systems (Editions Frontieres, Gif-sur-Yvette, France, 1992).
  13. C. J. van der Laan, H. J. Frankena, “Fast computation method for derivatives of multilayer stack reflectance,” Appl. Opt. 17, 538–541 (1978). [CrossRef]
  14. K.-O. Peng, M. R. de la Fonteijne, “Derivatives of transmittance and reflectance for an absorbing multilayer stack,” Appl. Opt. 24, 501–503 (1985). [CrossRef] [PubMed]
  15. D. Y. Smith, E. Shiles, M. Inokuti, “The optical properties of metallic aluminum,” in Handbook of Optical Constants of Solids, E. D. Palik, ed. (Academic, Orlando, Fla., 1985), pp. 369–406.
  16. H. R. Philipp, “Silicon dioxide (SiO2) (glass),” in Handbook of Optical Constants of Solids, E. D. Palik, ed. (Academic, Orlando, Fla., 1985), pp. 749–764.
  17. D. W. Lynch, W. R. Hunter, “Comments on the optical constants of metals and an introduction to the data for several metals,” in Handbook of Optical Constants of Solids, E. D. Palik, ed. (Academic, Orlando, Fla., 1985), pp. 275–367.
  18. J. A. Dobrowolski, J. R. Pekelsky, R. Pelletier, M. Ranger, B. T. Sullivan, A. J. Waldorf, “A practical magnetron sputtering system for the deposition of optical multilayer coatings,” Appl. Opt. 31, 3784–3789 (1992). [CrossRef] [PubMed]
  19. J. A. Dobrowolski, B. T. Sullivan, “Universal antireflection coatings for the visible spectral region,” Appl. Opt. 35, 4993–4997 (1996). [CrossRef] [PubMed]
  20. B. T. Sullivan, J. A. Dobrowolski, “Deposition error compensation for optical multilayer coatings. II. Experimental results—sputtering system,” Appl. Opt. 32, 2351–2360 (1993). [CrossRef] [PubMed]

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