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Applied Optics

Applied Optics


  • Vol. 35, Iss. 28 — Oct. 1, 1996
  • pp: 5573–5582

Low-level scattering and localized defects

Sophie Maure, Gérard Albrand, and Claude Amra  »View Author Affiliations

Applied Optics, Vol. 35, Issue 28, pp. 5573-5582 (1996)

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We investigate the origin of low-level scattering from high-quality coatings produced by ion-assisted deposition and ion plating. For this purpose we use the polarization ratio of light scattering to separate surface and bulk effects that characterize the intrinsic action of the thin-film materials. In the first step the method is tested and validated at scattering levels greater than 10−5. In the second step it is applied at low levels, and the results reveal some anomalies. To conclude, we perform a detailed analysis of scattering resulting from the presence of a few localized defects in the coatings.

© 1996 Optical Society of America

Original Manuscript: November 15, 1995
Published: October 1, 1996

Sophie Maure, Gérard Albrand, and Claude Amra, "Low-level scattering and localized defects," Appl. Opt. 35, 5573-5582 (1996)

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