The transmitted scattered energy of plane electromagnetic waves from a thin metallic film with shallow rough interfaces bounded by two semi-infinite media is calculated. Both interfaces are modeled as independent stationary random processes with a Gaussian roughness spectrum. Scattering of light is calculated for both TM (p) or TE (s) polarizations for normal and oblique angles of incidence. An integral equation is obtained for the transmitted field based on the Rayleigh method and their solution involves Fourier coefficients, depending on the roughness profiles. We present some results for the case of a single thin metallic film in the attenuated total reflection configuration for s and p polarization around the angle of the excitation of surface-plasma waves θsp. The transmitted scattered intensity shows a maximum at the resonant angle θsp in the case of p polarization.
© 1996 Optical Society of America
Original Manuscript: November 20, 1995
Revised Manuscript: March 5, 1996
Published: October 1, 1996
Raúl García Llamas and Luis E. Regalado, "Transmitted scattered light from a thin film with shallow random rough interfaces," Appl. Opt. 35, 5595-5599 (1996)