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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 35, Iss. 31 — Nov. 1, 1996
  • pp: 6173–6178

Measurement of the refractive-index profile of planar waveguides by the use of a double Lloyd's interferometer

W. A. Ramadan, E. Fazio, and M. Bertolotti  »View Author Affiliations


Applied Optics, Vol. 35, Issue 31, pp. 6173-6178 (1996)
http://dx.doi.org/10.1364/AO.35.006173


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Abstract

We present a nondestructive experimental method to measure monotonically varying refractive-index profiles of planar waveguides. The technique is a modification of the Lloyd's mirage setup proposed by Allman et al. [Appl. Opt. 33, 1806 (1994)] in order to have a reference phase distribution for the interference pattern. The theoretical calculations have been implemented to account for multiple reflections inside the sample. An application of the method to ion-exchanged glass waveguides is reported.

© 1996 Optical Society of America

History
Original Manuscript: January 5, 1996
Revised Manuscript: April 15, 1996
Published: November 1, 1996

Citation
W. A. Ramadan, E. Fazio, and M. Bertolotti, "Measurement of the refractive-index profile of planar waveguides by the use of a double Lloyd's interferometer," Appl. Opt. 35, 6173-6178 (1996)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-35-31-6173

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