The low-frequency intensity noise at 25 MHz of a Fabry–Perot semiconductor laser is measured as a function of injection current. All the measurements are taken at room temperature and the laser is operated with a commercial current source (the conditions under which laser diodes are often used). At the highest injection current of twice threshold, the intensity noise is 5.5 dB above the shot-noise limit. When the longitudinal side mode suppression of the laser is 20 dB or larger, the intensity noise is modeled adequately by an expression derived from the single-mode, small-signal, linearized, semiclassical rate equations. All the parameters used in the theory are derived or referenced.
© 1996 Optical Society of America
Original Manuscript: November 20, 1995
Revised Manuscript: July 2, 1996
Published: November 20, 1996
M. M. Hall and J. L. Carlsten, "Low-frequency intensity noise in semiconductor lasers," Appl. Opt. 35, 6438-6444 (1996)