Lifetime Estimation for Hermetically Packaged 10 Gb/sec LiNbO<sub>3</sub> Optical Modulators

Hirtoshi Nagata; Naoki Mitsugi; Kazumasa Kiuchi; Junichiro Minowa

doi:10.1364/AO.35.006842

Applied Optics
Vol. 35,
Issue 34,
pp. 6842-6843
(1996)
•https://doi.org/10.1364/AO.35.006842

Lifetime Estimation for Hermetically Packaged 10 Gb/sec LiNbO₃ Optical Modulators

Hirtoshi Nagata, Naoki Mitsugi, Kazumasa Kiuchi, and Junichiro Minowa

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Hirtoshi Nagata, Naoki Mitsugi, Kazumasa Kiuchi, and Junichiro Minowa, "Lifetime Estimation for Hermetically Packaged 10 Gb/sec LiNbO₃ Optical Modulators," Appl. Opt. 35, 6842-6843 (1996)

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Abstract

A life expectancy of hermetically sealed 10 Gb/sec LiNbO₃ optical modulators was obtained after aging them for 5000 hours at 85° C. After the test, no failure was found in the device parameters and the dc drift behavior. The lifetime was estimated to be over 20 years at ~50° C.

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Wafer No.	Chip No.	Insertion Loss [DdB]	return Loss IN [DdB]	Return Loss OUT [DdB]	Extinct-Ion Ratio [DdB]	Vp [DV]	Elctrl. BandWidth [DGHz]	Optical BandWidth [DGHz]
4-141	37	0.3	7.3	5.6	−3.0	0.1	−0.5	0.2
	40	0.5	0.9	0.0	−3.2	0.0	0.1	0.6
	48	0.5	4.1	2.7	−3.3	−0.1	−0.1	0.5
4-218	17	0.5	−11.0	−1.4	4.7	0.0	−0.9	−0.6
	31	−0.4	−0.4	3.2	2.0	−0.1	0.2	0.3
	32	0.3	0.1	0.4	−0.6	−0.1	0.2	0.3
	33	−0.1	−1.4	3.1	5.7	0.0	0.4	0.1
	34	−0.3	−3.8	11.0	3.7	0.0	0.3	0.2
	36	−0.6	0.9	1.0	0.3	0.1	0.2	0.3
	38	−0.8	1.2	4.9	6.1	0.1	0.4	0.2
4-248	21	0.0	−1.9	2.8	−2.8	0.0	1.0	NT
4-249	34	0.6	0.1	1.3	0.8	0.1	0.1	NT
average		0.04	−0.33	2.88	0.87	0.01	0.12	0.21
σ_n−1		0.48	4.40	3.25	3.56	0.08	0.47	0.32

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Applied Optics