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Applied Optics

Applied Optics


  • Vol. 35, Iss. 36 — Dec. 20, 1996
  • pp: 7066–7069

Selective detection of molecular ions in dc discharges by dual-beam Fourier transform spectroscopy

P. A. Martin and G. Guelachvili  »View Author Affiliations

Applied Optics, Vol. 35, Issue 36, pp. 7066-7069 (1996)

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A new method to detect molecular ions selectively in gas discharges by Fourier transform emission spectroscopy is proposed. This method is by dual-beam optical subtraction. The difference spectrum between blue and red Doppler-shifted components is obtained directly thus eliminating the large background that is due to neutral precursors.

© 1996 Optical Society of America

Original Manuscript: February 20, 1996
Published: December 20, 1996

P. A. Martin and G. Guelachvili, "Selective detection of molecular ions in dc discharges by dual-beam Fourier transform spectroscopy," Appl. Opt. 35, 7066-7069 (1996)

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