OSA's Digital Library

Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 35, Iss. 4 — Feb. 1, 1996
  • pp: 566–571

Modal analysis of noise in signal-processing-in-the-element detectors

Frank J. Effenberger and Glenn D. Boreman  »View Author Affiliations


Applied Optics, Vol. 35, Issue 4, pp. 566-571 (1996)
http://dx.doi.org/10.1364/AO.35.000566


View Full Text Article

Enhanced HTML    Acrobat PDF (211 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

Detector noise limits the performance of signal-processing-in-the-element detectors. For detectors to be optimized, an expression for the signal and noise must be found. The results of the eigenmode solution to the charge transport problem are used to derive the power spectral density of the noise in analytic form. This result is then coordinated with a similarly obtained modulation transfer function to yield a frequency-dependent signal-to-noise ratio (SNR). The SNR is used to reveal performance trends over several ranges of detector parameters. The most important result is that the contact boundary velocity strongly controls the SNR. The optimum SNR condition occurs when the contacts are not perfectly ohmic but exhibit a partially blocking behavior.

© 1996 Optical Society of America

History
Original Manuscript: December 2, 1994
Revised Manuscript: July 25, 1995
Published: February 1, 1996

Citation
Frank J. Effenberger and Glenn D. Boreman, "Modal analysis of noise in signal-processing-in-the-element detectors," Appl. Opt. 35, 566-571 (1996)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-35-4-566


Sort:  Author  |  Year  |  Journal  |  Reset  

References

  1. C. T. Elliot, “New detector for thermal imaging systems,” Electron. Lett. 17, 312–313 (1981). [CrossRef]
  2. D. J. Day, T. J. Shepherd, “Transport in photoconductors—I,” Solid-State Electron. 25, 707–712 (1982). [CrossRef]
  3. T. J. Shepherd, D. J. Day, “Transport in photoconductors—II,” Solid-State Electron. 25, 713–718 (1982). [CrossRef]
  4. G. D. Boreman, A. E. Plogstedt, “Modulation transfer function and number of equivalent elements for SPRITE detectors,” Appl. Opt. 27, 4331–4335 (1988). [CrossRef] [PubMed]
  5. S. P. Braim, A. P. Campbell, “TED (SPRITE) detector MTF,” IEE Conf. Publ. 228, 63–66 (1983).
  6. S. P. Braim, “The measurement and analysis of the noise frequency spectrum for SPRITE infrared detectors,” in Infrared Technology and Applications, L. R. Baker, A. Masson, eds., Proc. Soc. Photo-Opt. Instrum. Eng.590, 164–171 (1985).
  7. F. J. Effenberger, G. D. Boreman, “Modal analysis of transport processes in SPRITE detectors,” Appl. Opt. 34, 4651–4661 (1995). [CrossRef] [PubMed]
  8. A. Van der Ziel, Fluctuation Phenomena in Semi-Conductors (Academic, New York, 1959), pp. 33–36.
  9. C. T. Elliot, D. Day, D. J. Wilson, “An integrating detector for serial scan thermal imaging,” Infrared Phys. 22, 31–42 (1982). [CrossRef]
  10. P. Fredin, “Optimum choice of anamorphic ratio and boost filter parameters for a SPRITE based IR sensor,” in Infrared Imaging Systems: Design, Analysis, Modeling and Testing II, G. C. Holst, ed., Proc. Soc. Photo-Opt. Instrum. Eng.1488, 432–442 (1991).
  11. P. Fredin, G. D. Boreman, “Resolution-equivalent D* for SPRITE detectors,” Appl. Opt. 34, 7179–7182 (1995). [CrossRef] [PubMed]
  12. A. Józwikowska, K. Józwikowski, A. Rogalski, “Performance of mercury cadmium telluride photoconductive devices,” Infrared Phys. 31, 543–554 (1991). [CrossRef]

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

Figures

Fig. 1 Fig. 2
 

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited