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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 35, Iss. 7 — Mar. 1, 1996
  • pp: 1022–1024

Modulation-transfer-function-enhanced readout for SPRITE detectors

Frank J. Effenberger and Glenn D. Boreman  »View Author Affiliations


Applied Optics, Vol. 35, Issue 7, pp. 1022-1024 (1996)
http://dx.doi.org/10.1364/AO.35.001022


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Abstract

A new readout structure is investigated for signal-processing-in-the-element detectors that yields a modulation transfer function that is 3.5 dB better than those currently used. Experimental verification is performed in Si rather than HgCdTe, with similarity relations derived for the two semiconductors.

© 1996 Optical Society of America

History
Original Manuscript: July 24, 1995
Revised Manuscript: November 6, 1995
Published: March 1, 1996

Citation
Frank J. Effenberger and Glenn D. Boreman, "Modulation-transfer-function-enhanced readout for SPRITE detectors," Appl. Opt. 35, 1022-1024 (1996)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-35-7-1022


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References

  1. C. T. Elliott, “New detector for thermal imaging systems,” Electron. Lett. 17, 312–313 (1981).
  2. T. Ashley, C. T. Elliott, A. M. White, J. T. M. Wotherspoon, M. D. Johns, “Optimization of spatial resolution in SPRITE detectors,” Infrared Phys. 24, 25–33 (1984).
  3. G. D. Boreman, A. E. Plogstedt, “Spatial filtering by a line scanned nonrectangular detector: application to SPRITE readout MTF,” Appl. Opt. 28, 1165–1168 (1989).
  4. E. Buckingham, “On physically similar systems; illustrations of the use of dimensional analysis,” Phys. Rev. 4, 345–376 (1914).
  5. F. J. Effenberger, G. D. Boreman, “Modal analysis of transport processes in SPRITE detectors,” Appl. Opt. 34, 4651–4661 (1995).
  6. S. M. Sze, Physics of Semiconductor Devices (Wiley Interscience, New York, 1969), p. 58.
  7. A. Campbell, C. T. Elliott, A. M. White, “Optimization of SPRITE detectors in anamorphic imaging systems,” IEE Conf. Publ. London 263, 18–823 (1986).

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