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Applied Optics

Applied Optics


  • Vol. 36, Iss. 13 — May. 1, 1997
  • pp: 2783–2787

Contrast enhancement of electronic speckle pattern interferometry addition fringes

Noe Alcalá Ochoa, Fernando Mendoza Santoyo, Andrew J. Moore, and Carlos Pérez López  »View Author Affiliations

Applied Optics, Vol. 36, Issue 13, pp. 2783-2787 (1997)

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The electronic speckle pattern interferometer in the double-pulse addition mode can be used to measure physical parameters in unstable environmental conditions. Owing to additive optical noise, however, the fringe patterns obtained have poor contrast. Some methods that use subtraction of addition double-pulsed fringe patterns improve fringe visibility but impose a limitation in measurement time ranges. To increase this range, to be limited by only the pulse separation, the contrast enhancement of double-pulsed addition-fringe patterns with a spatial filter based on local-standard-deviation measurements is investigated. Computer simulations and experimental results are presented.

© 1997 Optical Society of America

Original Manuscript: June 7, 1996
Published: May 1, 1997

Noe Alcalá Ochoa, Fernando Mendoza Santoyo, Andrew J. Moore, and Carlos Pérez López, "Contrast enhancement of electronic speckle pattern interferometry addition fringes," Appl. Opt. 36, 2783-2787 (1997)

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