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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 36, Iss. 13 — May. 1, 1997
  • pp: 2788–2790

Zernike polynomials as a basis for wave-front fitting in lateral shearing interferometry

Hedser van Brug  »View Author Affiliations


Applied Optics, Vol. 36, Issue 13, pp. 2788-2790 (1997)
http://dx.doi.org/10.1364/AO.36.002788


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Abstract

A new method for handling Zernike polynomials is presented. Owing to its efficiency, this method enables the use of Zernike polynomials as a basis for wave-front fitting in shearography systems. An excerpt of a C++ class is presented to show how the polynomials are calculated and represented in computer memory.

© 1997 Optical Society of America

History
Original Manuscript: April 11, 1996
Revised Manuscript: September 3, 1996
Published: May 1, 1997

Citation
Hedser van Brug, "Zernike polynomials as a basis for wave-front fitting in lateral shearing interferometry," Appl. Opt. 36, 2788-2790 (1997)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-36-13-2788

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