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Applied Optics

Applied Optics

APPLICATIONS-CENTERED RESEARCH IN OPTICS

  • Vol. 36, Iss. 13 — May. 1, 1997
  • pp: 2791–2795

Axicon-type test interferometer for cylindrical surfaces: systematic error assessment

Norbert Lindlein, Roland Schreiner, Sven Brinkmann, Thomas Dresel, and Johannes Schwider  »View Author Affiliations


Applied Optics, Vol. 36, Issue 13, pp. 2791-2795 (1997)
http://dx.doi.org/10.1364/AO.36.002791


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Abstract

The principle and the alignment aberration functions are described for an axicon-type test interferometer for measuring cylindrical mantle surfaces. Additionally, we show that the derived systematic alignment functions fulfill for reasonably small misalignments the requirements for measurements in the range of approximately 1/100 of a fringe. We verify this with optical path-length calculations, using ray tracing.

© 1997 Optical Society of America

History
Original Manuscript: September 10, 1996
Revised Manuscript: October 25, 1996
Published: May 1, 1997

Citation
Norbert Lindlein, Roland Schreiner, Sven Brinkmann, Thomas Dresel, and Johannes Schwider, "Axicon-type test interferometer for cylindrical surfaces: systematic error assessment," Appl. Opt. 36, 2791-2795 (1997)
http://www.opticsinfobase.org/ao/abstract.cfm?URI=ao-36-13-2791


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References

  1. J. Schwider, “Verfahren und Anordnung zur Prüfung beliebiger Mantelflächen rotations symmetrischer Festkörper mittels synthetischer Hologramme,” GDR-Wirtschafts-Patent106,769 (5July1974).
  2. U. Krackhardt, J. Schwider, M. Schrader, N. Streibl, “Synthetic holograms written by a laser pattern generator,” Opt. Eng. 32, 781–785 (1993). [CrossRef]
  3. T. Dresel, J. Schwider, A. Wehrhahn, S. Babin, “Grazing incidence interferometry applied to the measurement of cylindrical surfaces,” Opt. Eng. 34, 3531–3535 (1995). [CrossRef]
  4. S. Brinkmann, T. Dresel, R. Schreiner, J. Schwider, “Axicon-type test interferometer for cylindrical surfaces,” Optik 102, 106–110 (1996).
  5. D. J. Whitehouse, Handbook of Surface Metrology (Institute of Physics Publishing, London, 1994).
  6. N. Lindlein, raytrace vers. 5.0, MIKOS, D-91058 Erlangen, Am Weichselgarten7 (1996).
  7. J. Schwider, “Advanced evaluation techniques in interferometry,” Prog. Opt. 28, 271–359 (1990). [CrossRef]

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